1711 Ergebnisse
Referenz
  421. Design Methodology for heterogeneous Machine Vision Systems  
F. Czerner, J. Zellmann J. Lioubov U. Neuhäuser GSPx/ISPC, 31.3.-3.4.2003, Dallas / USA  
Referenz
  422. Design of a Capacitive Humidity Sensor Frontend with an Adaptive Resolution for Energy Autonomous Applications  
Maximilian Wiener, Benjamin Saft 2019 15th Conference on Ph.D Research in Microelectronics and Electronics (PRIME), 15 - 18 July 2019, Lausanne, Switzerland, 2019, pp. 137-140, DOI: https://doi.org/10.1109/PRIME.2019.8787836  
Referenz
  423. Design of a High-Speed Photodetector IC for Blu-ray Disc R/W Systems  
R. Sommer, D. Krauße E. Schäfer E. Hennig Grenoble, France: DATE 2011, Design, Automation & Test in Europe. 14.-18.03.2011  
Referenz
  424. Design of a Power Amplifier Module in a Novel Silicon-Ceramic Substrate for an LTE Transmitter  
V. Silva Cortes, L. Liu, U. Stehr, M. Fischer A. Frank V. Chauhan M. Hein, J. Müller R. Weigel, G. Fischer, A. Hagelauer Asia Pacific Microwave Conference 2017, 13-17 November 2017, Kuala Lumpur  
Referenz
  425. Design of a superconductor-to-semiconductor interface circuit for high data rates  
Th.Ortlepp, H.Töpfer S. Wünsch R. Schwemlein J. Flamm E. Crocoll M. Siegel F.H. Uhlmann Poster 336. WE-Heraeus-Seminar Processing of Quantum Information in RSFQ Circuits and Qubits, 29.11.-1.12. 2004, Bad Honnef  
Referenz
  426. Design of a superconductor-to-semiconductor interface circuit for high data rates  
Th.Ortlepp, H.Töpfer S. Wünsch R. Schwemlein J. Flamm E. Crocoll M. Siegel F.H. Uhlmann ISEC 2005, 05.-09.09. 2005, Noordwijkerhout / Niederlande  
Referenz
  427. Design of a Test Station for Magnetoelectric Sensor Development  
Maximilian Krey, Hannes Toepfer Roman Paris Thomas Froehlich 2019 19th International Symposium on Electromagnetic Fields in Mechatronics, Electrical and Electronic Engineering (ISEF), 29 - 31 August 2019, Nancy, France, 2019, pp. 1-2, DOI: https://doi.org/10.1109/ISEF45929.2019.9097048  
Referenz
  428. Design of an interferometric test station for parallel inspection of MEMS  
C. Schäffel, S. Michael R. Paris A. Frank N. Zeike K. Gastinger M. Kujawinska U. Zeitner S. Beer Ilmenau. In Proceedings. 56. Int. wissenschaftliches Kolloquium der TU Ilmenau. URN: urn:nbn:de:gbv:ilm1-2011iwk-098:5  
Referenz
  429. Design of an interferometric test station for parallel inspection of MEMS  
C. Schäffel, S. Michael R. Paris A. Frank N. Zeike K. Gastinger M. Kujawinska U. Zeitner S. Beer Ilmenau: 56. IWK der TU Ilmenau. 12.09. - 16.09.2011  
Referenz
  430. Design of High Temperature Circuits in a 1µm SOI-Technology  
D. Nuernbergk, GMM-Workshop, Mai 2001  
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