Charakterisierung von neuen optoelektronischen Sensoren im Waferverbund. Foto: IMMS.
Charakterisierung von neuen optoelektronischen Sensoren im Waferverbund. Foto: IMMS.

Press releases

Schnelles Nachweissystem für Multiresistenzen bei Tuberkuloseinfektionen

Acht Partner aus Forschung und Industrie starten BMBF-Projekt FluoResYstmore »

From one of the world’s first USB hubs to AI

Video on 25 years of IMMS – transfers from basic research to industry more »

2020 annual report online

Here you can find the contents in brief and the entire report which is linked to further…more »

25 years of IMMS – Many thanks for all congratulations!

In video and text messages, our partners and funders illustrate with many examples how we jointly…more »

EDA Competition Award for "Trash or Treasure" - Intelligent Layout Processing

1st prize of the IEEE CEDA goes to young scientists from Ilmenau TU and IMMSmore »

International conferences on methods for the design of integrated circuits

Young scientists from electrical engineering visit Erfurt virtuallymore »

Dr.-Ing. Christoph Schäffel (* 25 July 1961, † 16. May 2021)

We are shocked and very saddened by his sudden death.more »
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Elektronischer Knowhow-Schutz für innovative Sensorsysteme

iC-Haus, IMMS und Wachendorff starten BMBF-Verbundprojekt VE-ARiSmore »
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Thüringer Projekt entwickelt neuartige Technologieplattform zum Nachweis von SARS-CoV-2

Änderung der elektrischen Leitfähigkeit macht Virusmaterial sichtbarmore »
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Hochgenau und batteriefrei per RFID messen

IMMS-Doktorand verteidigt Dissertation zu präziser passiver RFID-Sensorikmore »