RF Characterization up to 50 GHz
Measurement capabilities:
- S-parameters test 50 MHz ... 50 GHz
- noise measurement 0,3 GHz ... 26 GHz
- DC test 0,1 pA ... 1A,0,1 mV ...200V
- measurements in coaxial environment (N, SMA, 3.5mm, 2.92mm / K, 2.4mm)
- measurement with coplanar and microstrip interface also available
On-wafer test:
- semi automatic 8'' wafer prober PA200 (Suess Microtec) with probe shield© and thermo chuck ( -60°C .. 200°C)
- manual 6'' wafer prober SUMMIT 9000 (CASCADE)
- RF probe tips for wafer measurement in GSG – configuration ( 50 .. 200µm Pitch )
- RF-lab in a shielded cabin
Example of an DC- and S-parameters test setup for n channel RF CMOS transistors
- output characteristic Id(Vgs,Vds)
- S-parameters S11, S22 (Vgs) deembedded
