research project OCTOPUS

Objective

The OCTOPUS project stands for “Optimal Configurable Test Organization Platform with Synthesis Support”. In this project, IMMS is collaborating on future-oriented, modular test concepts with several other German companies, Konrad GmbH (Radolfzell), Atmel Germany GmbH (Heilbronn), Melexis GmbH and X-FAB Semiconductor Foundries AG (both from Erfurt), as well as with the Department of Circuit Design and the Department of High Frequency Engineering at the University of Nuremburg in Erlangen.

The goal of this research project is to develop a test platform that encompasses the hardware frame-work, software environment, and test development methodology. By having scalable test architecture, the test equipment will be able to keep pace with increasing demands without need for a change of test platform. By moving away from permanently configured large-scale testing applications and to-ward user-specific customized modular test systems, it should be possible to reduce test costs. Some other improvements include improving the sustainability of investments by ensuring compatibility with industry-standard modules from various vendors, automatic system configuration, as well as support for test synthesis. In its role as a research and development partner, IMMS wishes to ensure that new products and technologies migrate from the lab to production. Thus, new developments in test meth-odology can be used to advantage in actual manufacturing applications.

Research Progress and Status

The content of the project work is quite complex and includes both mixed-signal and RF tests, which are divided into seven work packages:

• WP1 Creation of test platform specifications
• WP2 Test specifications and test programming
• WP3 Modeling and simulation
• WP4 Electrical interfaces and test adapters
• WP5 Hardware architecture
• WP6 Software architecture
• WP7 System verification

In keeping with the core competencies at IMMS, the institute is heavily involved in work packages WP2, WP4, and WP5. In WP1 we have analyzed modular test platforms and vendors, and also de-termined the currently achievable performance parameters of modular test instruments. This work has revealed the importance of modular test systems for future-oriented measurement technology at the institute and for future cooperative efforts with partners in the microelectronics industry and other small to medium-sized companies. Starting with the specifications of the available IC test systems and stand-alone units as well as an analysis of all current and upcoming tasks, IMMS was required to pro-vide details on future test systems and thus determine the performance specifications of the test plat-form. Furthermore, testing of integrated optoelectronic circuits was determined to be a key application. These require mixed-signal and RF-tests as well as optoelectronic stimulation with special equipment. Here, the performance parameters of the test platform were to be checked for the three following cir-cuit groups using tests with varying degrees of complexity:

• PDICs (photo detecting integrated circuits)
• APCs (automatic power control)
• PDAs (photo diode arrays)

Perspective

OCTOPUS was started in June 2007 and will continue until May 2010. In the upcoming years, con-cepts for a modular test platform are to be developed and the optimization potential for a cost-efficient test is to be investigated. Tester modules for test platforms are currently available on the market but DUT adapters are not. This is a critical factor in realizing a test system that is ready for use. This re-quires new concepts for routing test resources flexibly and with high signal quality. Various adapters for microelectronic applications are to be evaluated and characterized. Furthermore, work is to be performed in evaluating various self-test and calibration strategies.