IMMS - Industrial Electronics and Measuring Technology

Characterization of Integrated Photo Diodes

Parameters of integrated photo diodes

  • sensitivity
  • sensitivity distribution
  • leakage andmain capacitance
  • transfer bandwith
  • transient behaviour
  • CV characteristic
on wafer tests

Measurement of -3dB bandwith with load variations and wave length as parameters

test board
bandwith vs. reverse voltage of a photo diode

Valid XHTML 1.0 Transitional