Lab Equipment
Special measurement environment
- shielded cabin (shielding efficiency 100 dB up to 26 GHz)
Equipment for wafer test
- semi automatic wafer prober Suess PA200 with thermo chuck (-60°C..200°C)
- manual wafer prober Suess PM 8 with thermo chuck ( 0°C .. 150 °C)
- manual wafer prober SUMMIT 9000
RF measurement equipment
- Network Analyzer HP8510C
- S Parameter Testset HP8517B (45MHz ... 50GHz)
- Network Analyzer E5071B (300 kHz...8.5 GHz)
- Synthesizer HP83651A
- Noise Figure Meter HP8970B/8971C
- Noise Figure Measurement System NP5 (ATN Microwave Inc.)
- Spectrum Analyzer E4404B (9kHz...6.7GHz)
- Spectrum Analyzer FSU26 ( 20 Hz... 26 GHz)
- Signal Generator E4432B (250kHz...3GHz)
- Signal Generator SML03 ( 9kHz...3.3 GHz)
- Power Meter HP437B
- DC Analyzer HP4142
- 4 Channel Real Time Scope SDA 9000 ( 9 GHz)
- ACP Probes ACP40 and 50 with 50, 100, 150 and 200 µm Pitch
Equipment for parameter extraction
- Multi Meter K2000
- Source Meter K2400
- Dual Source Meter K2602
- pA Meter HP4140B
- RLC Bridge HP4284A (Test Frequency 20Hz...1MHz)
- Parameter Analyzer 4157A
- Switch Matrix 5250A
Digital- and mixed-signal test equipment
- Digital Test System HP82000 (100 / 200 MHz, 72 ... 120 Test Channels)
- Logic Analyzer 1670G
- Audio Analyzer UPD (2 Hz .. 300 kHz)
- Signal Generators 33220A and 33250A (20 MHz and 80 MHz)
- Gain Phase Analyzer HP4194A (100Hz...40MHz)
- Impedance Gain Phase Analyzer Solartron SI1260 (µHz...30MHz)
- DSO's Agilent
Equipment for optoelectronic
- Semi Atomatic Wafer Prober Suess with Cross Table for optical Stimulation
- Optical Bench with Accessories
- Laser Modulator MDL 300 ( up to 2 GHz)
- Laser Sources Wavelength 405nm, 635nm, 785nm, 844nm
- Power Meter Q8221
- Bit Error Rate Tester MP3216
- 4 Channel Realtime DSO including optical/electrical Converters
Equipment for thermal treatment
- Thermo Stream TP4300 ( -60°C .. 210°C)
- Heating Cabinet Binder ( 25°C .. 350°C)