1/f Noise Measurement
The test setup is situated in a shielded cabin that is located in the Ilmenau branch of IMMS. The shielding effeciency of the cabin is min. 100dB up to 26 GHz. As an example the test setup for 1/f noise figure measurement for transistors and foto receivers is shown below. The noise power density can be characterized up to 100 kHz.
- schematic diagram of test setup for 1/f noise figure measurement
- photograph of test setup
- noise power density of an MOSFET with drain current as parameter
